X-ray ptychotomography in the near-field regime is a promising technique for high-resolution, quantitative, and nondestructive investigations in materials science, paleontology, and biomedicine. X-ray near-field ptychography has been previously demonstrated in projection and tomography mode, but the quantitativeness of the reconstructed data has never been discussed in detail. Here, we use measurements of a sample made of aluminum and nickel microparticles to evaluate the quantitativeness of the volumetric mass-density data. Moreover, we propose an algorithm (VortRem) for the removal of phase vortexes, a type of artifact that frequently occurs in holographic methods. VortRem and the results presented here may be fundamental for extending the applicability of this emerging technique to quantitative three-dimensional characterization studies of light as well as dense samples down to the nanoscale.

中文翻译：

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具有近场声谱技术的定量X射线纳米断层扫描的相涡去除

在材料科学，古生物学和生物医学领域，近场X射线分光成像技术是一种高分辨率，定量和无损研究的有前途的技术。先前已经在投影和断层摄影模式中证明了X射线近场刻印术，但从未详细讨论过重建数据的定量性。在这里，我们使用由铝和镍微粒制成的样品的测量值来评估体积质量密度数据的定量性。此外，我们提出了一种用于消除相涡的算法（VortRem），相涡是全息方法中经常出现的一种伪像。