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Fabrication and Study of the Electronic Structure of МоO 3 /Мо Nanofilms
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2020-12-28 , DOI: 10.1134/s1027451020060026
G. Kh. Allayarova

Abstract

The composition, the surface morphology, and the crystalline and electronic structure of МоО3 nanofilms are studied using a set of methods, namely, scanning electron spectroscopy and high energy electron diffraction, photoelectron spectroscopy, and secondary electron emission. These nanofilms are obtained by implanting \({\text{O}}_{{\text{2}}}^{{\text{ + }}}\) ions into a Mo single crystal heated to Т = 850 K. Films with different thicknesses (~30, 60, and 90 Å) are obtained at an ion energy of 1–5 keV and a dose of D = (4–8) × 1017 cm–2. It is shown that a continuous and homogeneous polycrystalline МоО3 film with a surface roughness of at most 1.5 nm is formed. The band gaps of these films are ~3.4 eV, and the widths of the conduction bands are 4.5 eV. It is discovered that there are four maxima of the density of electronic states in the valence band; probably, they are due to hybridization of the N5, N45, N4 energy levels of Mo with the L2, L23, and L3 energy levels of oxygen.



中文翻译:

МоO3 /Мо纳米膜的电子结构的制备和研究

摘要

组合物中,表面形态,和МоО的晶体和电子结构3纳米膜是使用一组的方法,即,在扫描电子能谱和高能电子衍射,光电子能谱和二次电子发射研究。这些纳米膜是通过将\({\ text {O}} _ {{\ text {2}}} ^ {{\ text {+}}} \)离子注入加热到Т = 850 K的Mo单晶中获得的。以1–5 keV的离子能量和D =(4–8)×10 17 cm –2的剂量获得具有不同厚度(〜30、60和90Å)的薄膜。结果表明,连续的和均匀的多晶МоО 3形成具有至多1.5nm的表面粗糙度的膜。这些薄膜的带隙约为3.4 eV,导带的宽度为4.5 eV。发现在价带中有四个电子态密度的最大值。可能是由于Mo的N 5N 45N 4能级与氧的L 2L 23L 3能级杂交所致。

更新日期:2020-12-28
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