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Peculiarities of the Current–Voltage Characteristic of n -GaP– p -(InSb) 1 – x (Sn 2 ) x Heterostructures
Technical Physics Letters ( IF 0.6 ) Pub Date : 2020-12-14 , DOI: 10.1134/s1063785020110279
A. S. Saidov , A. Yu. Leiderman , Sh. N. Usmonov , U. P. Asatova

Abstract

The current–voltage (IV) characteristics of n-GaP–p-(InSb)1 – x(Sn2)x (0 ≤ x ≤ 0.05) heterostructures have been studied. At low voltages (V < 0.5 V), the IV curve is described by the exponential law I = I0exp(qV/ckT), while at higher voltages (from 0.5 to 1.8 V) it obeys the power law I = AVm with various values of coefficient A and exponent m dependent on the voltage. At still higher voltages (from 2.10 to 2.48 V), the characteristic exhibits a sublinear behavior described by the equation V = V0exp(Jd/2kTμpNt).



中文翻译:

n -GaP– p-(InSb)1 – x(Sn 2)x异质结构的电流-电压特性的特殊性

摘要

的电流-电压(- V)的特性ñ -GaP- p - (锑化铟)1 - X(SN 2X(0≤ X ≤0.05)异质结构进行了研究。在低电压(V <0.5 V)时,- V曲线由指数定律描述 =0 EXP(QV / CKT),而在更高的电压(0.5〜1.8V)它遵循幂定律=具有各种系数A的AV m指数m取决于电压。在更高的电压(从2.10到2.48 V)时,特性表现出次线性行为由等式描述V = V 0 EXP(JD / 2 KT μ p Ñ)。

更新日期:2020-12-14
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