The disintegration of a copper electrode and the subsequent transport of Cu⁺ ions into a borosilicate glass has been qualitatively observed in a recent electron charge attachment induced transport (e-CAIT) experiment [SSI, 339 (2019) 114997]. This work reports the quantitative analysis of the transport coefficients of Cu⁺ and two native alkali ions in the glass. Electron attachment to the front side of the sample generates a negative surface potential inducing transport of mobile native alkali ions towards the front side. At the backside of the sample, in contact with a copper electrode, the electric field increases as a result of the alkali ion transport. Under these conditions, Cu⁺ ions become ejected from the electrode and enter into the glass. The concentration depth profiles of all mobile species in the glass have been quantitatively analyzed by means of the Nernst-Planck-Poisson theory. As the result of the analysis we arrive at a diffusion coefficient for Cu⁺ ions in the borosilicate glass at 160 °C of D(Cu⁺) = (5.2 ± 1) · 10⁻²⁰ m²/s.

to be published in Solid State Ionics.

在最近的电子电荷附着诱导传输（e-CAIT）实验[SSI，339（2019）114997]中已定性地观察到铜电极的崩解和随后的Cu ⁺离子向硼硅酸盐玻璃的传输。这项工作报告了对玻璃中Cu ⁺和两种天然碱金属离子的迁移系数的定量分析。电子附着到样品的正面会产生负表面电势，从而引起可移动的天然碱离子向正面的迁移。在样品的背面，与铜电极接触，由于碱离子传输，电场增加。在这些条件下，Cu ⁺离子从电极喷出并进入玻璃。借助于能斯特-普朗克-泊松理论对玻璃中所有可移动物质的浓度深度分布进行了定量分析。分析的结果是，在160°C的D（Cu ⁺）=（5.2±1）·10 ^-20  m ² / s时，硼硅酸盐玻璃中Cu ⁺离子的扩散系数。

将在《固态离子学》上发表。