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An Investigation of the Conductive and Ferroelectric Properties of BZT Films
Technical Physics ( IF 0.7 ) Pub Date : 2020-12-11 , DOI: 10.1134/s1063784220120105
E. V. Gushchina , B. R. Borodin , V. A. Sharov , V. V. Osipov , S. I. Pavlov , M. A. Yagovkina , M. S. Dunaevskii

Abstract

Local polarization processes in BaTi1 – xZrxO3 thin films are studied using contact conductive scanning probe microscopy and piezoelectric response microscopy. The relationship between the direction of the created domains and the magnitude of the flowing currents is established. The value of the residual polarization is found. Using scanning probe microscopy, the hysteresis loop is measured and the values of the piezoelectric modulus dzz and coercive field Ec for these films are determined.



中文翻译:

BZT薄膜的导电和铁电性能研究

摘要

使用接触导电扫描探针显微镜和压电响应显微镜研究了BaTi 1 – x Zr x O 3薄膜中的局部极化过程。建立的域的方向和流动电流的大小之间的关系被建立。找到残余极化的值。使用扫描探针显微镜,测量磁滞回线,并确定这些膜的压电模量d zz和矫顽场E c的值。

更新日期:2020-12-12
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