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Attenuation of doubly charged ion interferences on arsenic and selenium by ICP-MS under low kinetic energy collision cell conditions with hydrogen cell gas
Journal of Analytical Atomic Spectrometry ( IF 3.4 ) Pub Date : 2020-12-10 , DOI: 10.1039/d0ja00301h
Naoki Sugiyama 1, 2, 3
Affiliation  

Most spectral interferences that arise in ICP-MS are caused by matrix or plasma-based ion overlaps on an analyte ion. These interferences can be effectively controlled using collision/reaction cell (CRC) technology operating in helium (He) collision cell mode, improving the data quality of trace elements in a variety of matrices. However, spectral interferences caused by doubly charged ions (M++), such as rare-earth element (REE++) ion interferences on arsenic (As) and selenium (Se), are difficult to resolve using single quadrupole ICP-MS operating in He collision cell mode. Therefore, a new method was investigated using hydrogen (H2) as a collision cell gas and kinetic energy discrimination (KED) to separate the ions. For KED to be successful there needs to be a difference in the collisional cross-section of the analyte ion and interfering ion. The collisional cross-section of a doubly charged ion is greater with H2 molecules than He (the traditional ICP-MS collision cell gas) due to the higher polarizability of H2. Utilizing these physical characteristics, the reduction of M++ interferences by KED was investigated both theoretically and experimentally. The developed low kinetic energy H2 collision cell method correctly measured 1 μg L−1 of As and Se in the presence of 0.5 mg L−1 each of 16 REEs. No mathematical interference correction equations were needed. A conventional He collision cell method provided a false positive result for As and Se of more than 10 μg L−1.

中文翻译:

ICP-MS在低动能碰撞池条件下用氢电池气体对砷和硒上的双电荷离子干扰进行衰减

ICP-MS中产生的大多数光谱干扰是由分析物离子上的基质或基于等离子体的离子重叠引起的。使用在氦气(He)碰撞池模式下运行的碰撞/反应池(CRC)技术可以有效地控制这些干扰,从而改善各种矩阵中痕量元素的数据质量。但是,使用单四极杆ICP-MS操作很难解决由双电荷离子(M ++)引起的光谱干扰,例如稀土元素(REE ++)对砷(As)和硒(Se)的离子干扰。在He碰撞池模式下。因此,研究了一种使用氢(H 2)作为碰撞池气体和动能鉴别(KED)来分离离子。为了使KED成功,分析物离子和干扰离子的碰撞截面必须有所不同。由于H 2的极化率较高,所以H 2分子的双电荷离子的碰撞截面比He(传统的ICP-MS碰撞池气体)更大。利用这些物理特性,从理论和实验上研究了KED对M ++干扰的减少。已开发的低动能H 2碰撞池方法在存在0.5 mg L -1的情况下正确测量了1μgL -1的As和Se16个REE中的每个。无需数学干扰校正方程式。传统的He碰撞池方法对As和Se的假阳性结果超过10μgL -1
更新日期:2020-12-10
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