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Phase shift imaging in thin films using CW Z-scan based technique
Physica B: Condensed Matter ( IF 2.8 ) Pub Date : 2020-12-09 , DOI: 10.1016/j.physb.2020.412608
Oumar Ba , Mihaela Chis , Christophe Cassagne , Georges Boudebs

The beam waist relative variation (BWRV) method known as a Z-scan based technique is used to demonstrate its feasibility in characterizing the thermal effects induced by a continuous laser beam in different materials. A study of several classical solvent-based solutions (water, ethanol, methanol …) is carried out before introducing the extension of the BWRV method to laterally map the tested sample. We show that the transverse xy-scan of the sample allows to extract an image of the phase shift due to local thermal heating. This new device, called XYZ-scan, is designed for the thermal characterization of inhomogeneous samples. An example will be given on an inhomogeneous 1.6μm thick thin film doped with silver nanoparticles.



中文翻译:

基于CW Z扫描技术的薄膜相移成像

使用束腰相对变化(BWRV)方法(称为Z扫描技术)来证明其在表征由连续激光束在不同材料中引起的热效应的可行性。在引入BWRV方法的扩展以横向绘制测试样品之前,先对几种经典的基于溶剂的溶液(水,乙醇,甲醇等)进行了研究。我们表明,样品的横向xy扫描允许提取由于局部热引起的相移图像。这款名为XYZ-scan的新设备旨在对不均匀样品进行热表征。一个不均匀的例子1.6μ 纳米银掺杂的厚薄膜。

更新日期:2021-01-06
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