In our previous paper, we showed that the molecular weight of linear, trimethyl‐terminated polydimethyl siloxane (PDMS) can be estimated using a standard curve by measuring PDMS endgroup‐related signal normalized to backbone‐related signal for PDMS films that are thick relative to the information depth of SIMS. Within industrial surface analysis laboratories, it is more likely that PDMS fluid is encountered as a thin film, perhaps as a contaminant or an additive that has exuded from a bulk material. This paper explores the influence of PDMS film thickness, substrate type, and primary ion projectile type (cluster vs. monoatomic) on the ratio of measured endgroup:backbone peak area ratio. These factors are shown to have a significant influence on the measured spectra, and these effects should be carefully considered before making molecular weight estimates of PDMS based on SIMS peak ratios.

中文翻译：

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第二部分：底物类型，膜厚度和伯离子类型对通过二次离子质谱法表征线性聚二甲基硅氧烷膜分子量的影响

在我们之前的论文中，我们表明可以使用标准曲线通过测量相对于厚于PDMS的PDMS膜归一化为与骨架相关的信号归一化的PDMS端基相关信号，使用标准曲线估算线性三甲基封端的聚二甲基硅氧烷（PDMS）的分子量。 SIMS的信息深度。在工业表面分析实验室中，PDMS流体更可能以薄膜形式遇到，可能是从散装材料中渗出的污染物或添加剂。本文探讨了PDMS膜厚，底物类型和初级离子弹丸类型（簇与单原子）对测得的端基：骨架峰面积比的影响。这些因素对测量的光谱有显着影响，