This paper presents a planar and compact microwave resonator sensor to characterize materials. The geometry of the resonator is based on the Sierpinski fractal curve and has four poles in the frequency range from 0.5 GHz to 5.5 GHz. Any of the four poles can be used to measure samples with low permittivity values, where the first pole is suitable for samples with high permittivity values. The sensitivity of the poles and return losses of the sensor are presented and obtained using a full-wave 3D simulator software. The device is manufactured and validated through a comparison between simulated and measured results.

中文翻译：

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基于Sierpinski分形曲线的用于材料表征的平面传感器

本文提出了一种平面且紧凑的微波谐振器传感器来表征材料。谐振器的几何形状基于Sierpinski分形曲线，在0.5 GHz至5.5 GHz的频率范围内具有四个极点。四个极点中的任何一个都可以用来测量低介电常数值的样品，其中第一个极点适合于具有高介电常数值的样品。使用全波3D模拟器软件可以显示并获得磁极的灵敏度和传感器的回波损耗。通过比较模拟结果和测量结果来制造和验证该设备。