Detectors are revolutionizing possibilities in scanning transmission electron microscopy because of the advent of direct electron detectors that record at a high quantum efficiency and with a high frame rate. This allows the whole back focal plane to be captured for each pixel in a scan and the dataset to be processed to reveal whichever features are of interest. There are many possible uses for this advance of direct relevance to understanding the nano- and atomic-scale structure of materials and heterostructures. This article gives our perspective of the current state of the field and some of the directions where it is likely to go next. First, a wider overview of the recent work in this area is given before two specific examples of its application are given: one is imaging strain in thin films and the other one is imaging changes in periodicity along the beam direction as a result of the formation of an ordered structure in an epitaxial thin film. This is followed by an outlook that presents future possible directions in this rapidly expanding field.

中文翻译：

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探测器——扫描透射电子显微镜的持续革命以及为什么这对材料表征很重要

由于以高量子效率和高帧速率记录的直接电子探测器的出现，探测器正在彻底改变扫描透射电子显微镜的可能性。这允许为扫描中的每个像素捕获整个后焦平面，并处理数据集以显示感兴趣的任何特征。这种与理解材料和异质结构的纳米和原子级结构直接相关的进步有许多可能的用途。这篇文章给出了我们对该领域当前状态的看法以及它下一步可能发展的一些方向。首先，在给出其应用的两个具体示例之前，先对这一领域的近期工作进行更广泛的概述：一种是薄膜中的成像应变，另一种是由于在外延薄膜中形成有序结构而导致沿光束方向的周期性变化。紧随其后的是展望，在这个快速发展的领域中提出了未来可能的方向。