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In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation
Microscopy and Microanalysis ( IF 2.8 ) Pub Date : 2020-11-23 , DOI: 10.1017/s1431927620024678 Lex Pillatsch , Szilvia Kalácska , Xavier Maeder , Johann Michler
中文翻译:
原位原子力显微镜基于深度校正的三维聚焦离子束的飞行时间二次离子质谱:空间分辨率、表面粗糙度、氧化
更新日期:2020-11-23
Microscopy and Microanalysis ( IF 2.8 ) Pub Date : 2020-11-23 , DOI: 10.1017/s1431927620024678 Lex Pillatsch , Szilvia Kalácska , Xavier Maeder , Johann Michler
中文翻译:
原位原子力显微镜基于深度校正的三维聚焦离子束的飞行时间二次离子质谱:空间分辨率、表面粗糙度、氧化