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Synthesis, Growth and Characterization of Cu2CoSnS4 Thin Films via Thermal Evaporation Method
Optik ( IF 3.1 ) Pub Date : 2020-11-22 , DOI: 10.1016/j.ijleo.2020.166054
H. Hammami , M. Marzougui , H. Oueslati , M. Ben Rabeh , M. Kanzari

Quaternary sulfide Cu2CoSnS4 (CCTS) thin films were deposited by vacuum thermal evaporation on heated substrates. The substrates temperatures are ranged from room temperature to 200 °C. After what, the as-deposited films were sulfurized under vacuum at 450 °C to optimize the stoechiometric stannite CCTS phase. The crystalline structure of the sulfurized CCTS thin films was examined by X-ray diffraction technique and Raman spectroscopy. Surface morphological, elemental compositions and optical properties were explored by scanning electron microscopy, energy dispersive spectroscopy and spectrophotometer UV-VIS-NIR, respectively. X-ray diffraction and Raman analysis confirm that the sulfurization process leads to the formation of single CCTS phase. Optical results show high absorption coefficients of 105 cm-1 in the visible range with direct optical band-gap in the range 1.40-1.43 eV. In addition, the p-type conductivity of CCTS thin films was confirmed by hot probe method. The degradation of methylene blue in the presence of post-sulfurized samples was found in the range of 62-73%. Optical and Photocatalytic properties proves that post-sulfurized samples are suitable for application in photovoltaic and photocatalysis.



中文翻译:

热蒸发法制备Cu 2 CoSnS 4薄膜的合成,生长和表征

硫化季铵Cu 2 CoSnS 4(CCTS)薄膜通过真空热蒸发沉积在加热的基板上。基板温度范围为室温到200°C。之后,将沉积的薄膜在真空中于450°C的温度下硫化,以优化化学计量的亚锡CCTS相。通过X射线衍射技术和拉曼光谱检查了硫化的CCTS薄膜的晶体结构。分别通过扫描电子显微镜,能量色散光谱和分光光度计UV-VIS-NIR探索了表面形态,元素组成和光学性质。X射线衍射和拉曼分析证实了硫化过程导致了单CCTS相的形成。光学结果显示高吸收系数10 5 cm -1在可见光范围内,直接光学带隙在1.40-1.43 eV范围内。另外,通过热探针法确认了CCTS薄膜的p型导电性。在存在后硫化样品的情况下,发现亚甲基蓝的降解率为62-73%。光学和光催化性能证明了后硫化的样品适用于光伏和光催化。

更新日期:2020-12-16
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