Abstract Since 2003, self-heating effect of phosphor which reduces the efficacy and reliability of phosphor conversion (Pc) light emitting diodes (LEDs), has been a growing research area of opto-thermal Pc-LED modeling. However, few studies have focused on the particles based nature of the phosphor self-heating. Based on a new approach, accurate Montro Carelo ray tracing simulations are performed in regions of interest over discretized control volumes where only a single phosphor particle is exposed to the light radiation. Governed by the Mie scattering effects, heat generation values of phosphor particles showed strong dependency on their optical and geometrical properties. Additionally, based on the emissive behavior of the LED, space above the LED can be divided into two irradiance levels; near and far scale regions. In near scale region, where irradiance levels are above 0.1 W/mm2, phosphor particles exhibited significant self-heating in milli-Watt scale values. Derived self-heating values are imported to simplified thermal models where phosphor particles showed a temperature rise in excess of 100 °C more than LED chip which can lead to considerable conversion efficiency loss and a reduction in lifetime. Higher temperatures are expected in higher irradiance levels where matrix material carbonization can also occur causing fire hazards.

中文翻译：

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基于粒子的荧光转换发光二极管中荧光粒子自热效应的研究

摘要 自 2003 年以来，荧光粉的自热效应降低了荧光粉转换 (Pc) 发光二极管 (LED) 的功效和可靠性，成为光热 Pc-LED 建模的一个不断增长的研究领域。然而，很少有研究关注磷光体自热的基于粒子的性质。基于一种新方法，在离散控制体积上的感兴趣区域中执行精确的 Montro Carelo 光线追踪模拟，其中只有单个磷光体粒子暴露在光辐射中。受米氏散射效应控制，荧光粉颗粒的发热值表现出强烈依赖于它们的光学和几何特性。此外，根据 LED 的发射行为，LED 上方的空间可分为两个辐照度级别；近、远尺度区域。在近尺度区域，在辐照度水平高于 0.1 W/mm2 的情况下，磷光体颗粒以毫瓦级值显示出显着的自热。导出的自热值被导入到简化的热模型中，其中荧光粉颗粒的温度升高超过 LED 芯片 100 °C，这会导致相当大的转换效率损失和寿命缩短。在较高的辐照度水平下预计会出现较高的温度，在这种情况下，基质材料也可能发生碳化，从而导致火灾危险。导出的自热值被导入到简化的热模型中，其中荧光粉颗粒的温度升高超过 LED 芯片 100 °C，这会导致相当大的转换效率损失和寿命缩短。在更高的辐照度水平下，预计温度会更高，其中基质材料碳化也可能发生，从而导致火灾危险。导出的自热值被导入到简化的热模型中，其中荧光粉颗粒的温度上升超过 LED 芯片 100 °C，这会导致相当大的转换效率损失和寿命缩短。在较高的辐照度水平下预计会出现较高的温度，在这种情况下，基质材料也可能发生碳化，从而导致火灾危险。