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A highly sensitive imaging polarimeter in the x-ray regime
Applied Physics Letters ( IF 4 ) Pub Date : 2020-11-16 , DOI: 10.1063/5.0028427 Benjamin Grabiger 1, 2 , Berit Marx-Glowna 2 , Ingo Uschmann 1, 2 , Robert Loetzsch 1, 2 , Gerhard G. Paulus 1, 2 , Kai S. Schulze 1, 2
Applied Physics Letters ( IF 4 ) Pub Date : 2020-11-16 , DOI: 10.1063/5.0028427 Benjamin Grabiger 1, 2 , Berit Marx-Glowna 2 , Ingo Uschmann 1, 2 , Robert Loetzsch 1, 2 , Gerhard G. Paulus 1, 2 , Kai S. Schulze 1, 2
Affiliation
We report on the development of a highly sensitive imaging polarimeter that allows for the investigation of polarization changing properties of materials in the x-ray regime. By combining a microfocus rotating anode, collimating multilayer mirrors, and two germanium polarizer crystals, we achieved a polarization purity of the two orthogonal linear polarization states of 8 × 10−8. This enables the detection of an ellipticity on the same order or a rotation of the polarization plane of 6 arcsec. The high sensitivity combined with the imaging techniques allows us to study the microcrystalline structure of materials. As an example, we investigated beryllium sheets of different grades, which are commonly used for fabricating x-ray lenses, with a spatial resolution of 200 μm, and observed a strong degradation of the polarization purity due to the polycrystalline nature of beryllium. This makes x-ray lenses made of beryllium unsuitable for imaging polarimeter with higher spatial resolution. The results are important for the development of x-ray optical instruments that combine high spatial resolution and high sensitivity to polarization.
中文翻译:
在 X 射线范围内的高灵敏度成像偏振计
我们报告了高灵敏度成像偏振计的开发,该偏振计允许研究材料在 X 射线范围内的偏振变化特性。通过结合微焦点旋转阳极、准直多层反射镜和两个锗偏振器晶体,我们实现了两个正交线性偏振态的偏振纯度为 8 × 10−8。这使得能够检测相同数量级的椭圆度或偏振平面旋转 6 弧秒。结合成像技术的高灵敏度使我们能够研究材料的微晶结构。例如,我们研究了通常用于制造 X 射线透镜的不同等级的铍板,其空间分辨率为 200 μm,并观察到由于铍的多晶性质,极化纯度严重下降。这使得由铍制成的 X 射线透镜不适用于具有更高空间分辨率的成像偏振计。这些结果对于开发兼具高空间分辨率和高偏振灵敏度的 X 射线光学仪器具有重要意义。
更新日期:2020-11-16
中文翻译:
在 X 射线范围内的高灵敏度成像偏振计
我们报告了高灵敏度成像偏振计的开发,该偏振计允许研究材料在 X 射线范围内的偏振变化特性。通过结合微焦点旋转阳极、准直多层反射镜和两个锗偏振器晶体,我们实现了两个正交线性偏振态的偏振纯度为 8 × 10−8。这使得能够检测相同数量级的椭圆度或偏振平面旋转 6 弧秒。结合成像技术的高灵敏度使我们能够研究材料的微晶结构。例如,我们研究了通常用于制造 X 射线透镜的不同等级的铍板,其空间分辨率为 200 μm,并观察到由于铍的多晶性质,极化纯度严重下降。这使得由铍制成的 X 射线透镜不适用于具有更高空间分辨率的成像偏振计。这些结果对于开发兼具高空间分辨率和高偏振灵敏度的 X 射线光学仪器具有重要意义。