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Evaluation and application of a new scintillator‐based heat‐resistant back‐scattered electron detector during heat treatment in the scanning electron microscope
Journal of Microscopy ( IF 2 ) Pub Date : 2020-12-17 , DOI: 10.1111/jmi.12979
R. Podor 1 , J. Mendonça 1, 2 , J. Lautru 1 , H. P. Brau 1 , D. Nogues 2 , A. Candeias 2 , P. Horodysky 3 , A. Kolouch 3 , M. Barreau 4 , X. Carrier 4 , N. Ramenatte 5 , S. Mathieu 5 , M. Vilasi 5
Affiliation  

A new high temperature detector dedicated to the collection of backscattered electrons is used in combination with heating stages up to 1050°C, in high vacuum and low vacuum modes in order to evaluate its possibilities through signal-to-noise ration measurements and different applications. Four examples of material transformations occurring at high temperature are herein reported: grain growth during annealing of a rolled platinum foil, recrystallization of a multi-phased alloy, oxidation of a Ni-based alloy and complex phase transformations occurring during the annealing of an Al-Si coated boron steel. The detector could be potentially adapted to any type of SEM and it offers good opportunities to perform high temperature experiments in various atmospheres. This article is protected by copyright. All rights reserved.

中文翻译:

基于闪烁体的新型耐热背散射电子探测器在扫描电子显微镜下热处理过程中的评价与应用

专用于收集背散射电子的新型高温探测器与高达 1050°C 的加热台结合使用,在高真空和低真空模式下,通过信噪比测量和不同应用评估其可能性。本文报道了在高温下发生的材料转变的四个例子:轧制铂箔退火过程中的晶粒生长、多相合金的再结晶、Ni 基合金的氧化和铝退火过程中发生的复杂相变。硅涂层硼钢。该探测器可能适用于任何类型的 SEM,并为在各种气氛中进行高温实验提供了良好的机会。本文受版权保护。版权所有。
更新日期:2020-12-17
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