当前位置: X-MOL 学术Microelectron. Reliab. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Toward standardization of low impedance contact CDM
Microelectronics Reliability ( IF 1.6 ) Pub Date : 2021-01-01 , DOI: 10.1016/j.microrel.2020.114011
Nathan Jack , Brett Carn , Josh Morris

Abstract The 16.6 Ω implementation of contact CDM (LICCDM) recently published in ANSI-ESD Standard Practice 5.3.3 is shown to produce waveforms of similar shape, Ifail, and Ipeak vs. CDUT dependency as JS-002. The non-monotonicity of JS-002 at low voltages is overcome using LICCDM. A path to joint standardization with air discharge testing is proposed.

中文翻译:

迈向低阻抗接触式 CDM 的标准化

摘要 最近在 ANSI-ESD 标准实践 5.3.3 中发布的接触式 CDM (LICCDM) 的 16.6 Ω 实现显示产生与 JS-002 相似形状、Ifail 和 Ipeak vs. CDUT 依赖性的波形。使用 LICCDM 克服了 JS-002 在低电压下的非单调性。提出了与空气排放测试联合标准化的途径。
更新日期:2021-01-01
down
wechat
bug