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Nanowire Detection in AFM Images Using Deep Learning
Microscopy and Microanalysis ( IF 2.8 ) Pub Date : 2020-11-17 , DOI: 10.1017/s143192762002468x Huitian Bai , Sen Wu
中文翻译:
使用深度学习在 AFM 图像中检测纳米线
更新日期:2020-11-17
Microscopy and Microanalysis ( IF 2.8 ) Pub Date : 2020-11-17 , DOI: 10.1017/s143192762002468x Huitian Bai , Sen Wu
中文翻译:
使用深度学习在 AFM 图像中检测纳米线