We discuss the applicability of laser induced breakdown spectroscopy (LIBS) for deuterium retention analysis in compact and porous tungsten-oxide (W-O) coatings. Deuterium loading was performed by exposing the coatings to deuterium plasma in Magnum-PSI linear plasma device.

The deuterium signals obtained by ex-situ LIBS had sufficiently good signal-to-noise ratio for reliable separation of essentially broadened hydrogen and deuterium lines as well as for comparison of the lateral and depth distributions of deuterium in the coatings. Strong deuterium signal was obtained for the first laser shot which corresponded to the surface layer of the W-O coatings whereas deeper in the coating the signal decreased to noise level. In addition, the deuterium signal was highest in the central region of compact W-O coating. For both coatings, depth profiles of elements obtained by LIBS match with those recorded by secondary ion mass spectroscopy (SIMS) in the lateral direction along the sample surface. The results of LIBS and SIMS results were supported by Scanning Electron Microscopy (SEM) and X-ray diffraction (XRD) data which showed that the exposure to deuterium plasma resulted in remarkable changes in the surface morphology along the sample surface. The study demonstrates the LIBS potential in deuterium retention measurements in plasma facing components.

我们讨论了致密和多孔氧化钨（WO）涂层中氘保留分析的激光诱导击穿光谱（LIBS）的适用性。通过在Magnum-PSI线性等离子体装置中将涂层暴露于氘等离子体来进行氘加载。

通过异位LIBS获得的氘信号具有足够好的信噪比，可以可靠地分离出基本上加宽的氢和氘线，并且可以比较涂层中氘的横向和深度分布。对于第一个激光发射，获得了很强的氘信号，这与WO涂层的表面层相对应，而在涂层中越深，信号降低到噪声水平。另外，氘信号在致密的WO涂层的中心区域最高。对于这两种涂层，通过LIBS获得的元素的深度轮廓与通过二次离子质谱（SIMS）记录的元素沿样品表面的横向轮廓相匹配。LIBS和SIMS结果得到了扫描电子显微镜（SEM）和X射线衍射（XRD）数据的支持，这些数据表明，暴露于氘等离子体中会导致沿样品表面的表面形态发生显着变化。该研究证明了面向血浆组件中氘保留量的LIBS潜力。