The cover image is based on the Full Article Correlation between ion impurity in thermally activated delayed fluorescence organic light‐emitting diode materials and device lifetime by Masaru Inoue et al., https://doi.org/10.1002/jsid.922.

中文翻译：

---

额外的封面

封面图片基于Masaru Inoue等人（https://doi.org/10.1002/jsid.922）上的热活化延迟荧光有机发光二极管材料中的离子杂质与器件寿命之间的全文相关性。