Abstract We report on the effect of thickness on the magnetic properties and domain wall motion in as deposited Fe2CoSi thin films. Reflections present in selected area electron diffraction (SAED) micrograph infer that they are allowed reflections and are related to the Fe2CoSi. The coercivity is found to increase with the film thickness and the same is explained on the basis of Neel domain wall model. Longitudinal magneto-optical Kerr effect (L – MOKE) infers that the formation of ripple kind of domains that depend on the orientation of the field. L – MOKE data also infers nearly perfect 4 – fold anisotropy for the film with thickness 5 nm and a weaker 4 – fold anisotropy at higher thicknesses. Up on varying the angle between magnetic field and the film edge (0⁰ – 90⁰), indeed there is a transformation of the film magnetization from easy direction to hard direction. Fast Fourier transform of magnetic force microscopy (MFM) and polar plots infer a uniaxial anisotropy and a four-fold anisotropy in the films. Micromagnetic simulations infer that the coercivity value depends on the void size and enhances up to certain radius, above which it decreases. Present results would indeed be helpful for the future spintronic applications.

中文翻译：

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Fe2CoSi 薄膜中厚度依赖的畴壁动力学

摘要 我们报告了厚度对沉积的 Fe2CoSi 薄膜中磁性和畴壁运动的影响。选区电子衍射 (SAED) 显微照片中存在的反射推断它们是允许的反射并且与 Fe2CoSi 相关。发现矫顽力随着薄膜厚度的增加而增加，并在尼尔畴壁模型的基础上进行了解释。纵向磁光克尔效应 (L – MOKE) 推断波纹类域的形成取决于场的方向。L – MOKE 数据还推断出厚度为 5 nm 的薄膜具有近乎完美的 4 – 倍各向异性，并且在更高厚度时具有较弱的 4 – 倍各向异性。改变磁场和薄膜边缘之间的角度（0⁰ – 90⁰），确实存在薄膜磁化从易向向硬向的转变。磁力显微镜 (MFM) 和极坐标图的快速傅立叶变换推断出薄膜中的单轴各向异性和四倍各向异性。微磁模拟推断矫顽力值取决于空隙尺寸并增强到一定半径，超过该半径则减小。目前的结果确实有助于未来的自旋电子应用。