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Quantitative relation between thickness and grafting density of temperature‐responsive poly(N‐isopropylacrylamide‐co‐acrylamide) thin film using synchrotron‐source ATR‐FTIR and spectroscopic ellipsometry
Surface and Interface Analysis ( IF 1.7 ) Pub Date : 2020-11-05 , DOI: 10.1002/sia.6912
Phongphot Sakulaue 1 , Tossaporn Lertvanithphol 2 , Pitak Eiamchai 2 , Wanwipa Siriwatwechakul 1
Affiliation  

Poly(N‐isopropylacrylamide‐co‐acrylamide) (PNIAM‐co‐AM) grafted onto tissue culture polystyrene surfaces (TCPSs) with different thicknesses and grafting densities were prepared by varying the spin‐coating speed and UV irradiation time for use in cell sheet engineering. The thickness of the PNIAM grafted surface, less than 30 nm, was believed to influence protein adhesion and cell attachment. However, methods for determining the thicknesses of a thin surface (nanometer scale) are still a challenge. In this study, a model was developed to relate the thickness of the PNIAM‐co‐AM film to its grafting density. Spectroscopic ellipsometry (SE) and attenuated total reflection‐Fourier transform infrared spectroscopy (ATR‐FTIR) with synchrotron radiation were used to quantify the thickness and the grafting density, respectively. The amount of the grafted copolymer was determined from quantitative ATR‐FTIR by relating the signals at wavenumber 1,654 to 1,600 cm−1 (A1,654/A1,600) to the known grafting density. A combination of SE and ATR‐FTIR was used to construct a linear model (h = 6.29σ + 2.24), to obtain the grafting density (σ) from the film thickness (h) with R2 = 0.93. To validate the model, random samples were prepared with different thicknesses and grafting densities. The linear model was used to predict the grafting density, which was nearly equal to the measured values.

中文翻译:

同步辐射源ATR-FTIR和椭圆偏振光谱法测定温度响应型聚(N-异丙基丙烯酰胺-共丙烯酰胺)薄膜的厚度与接枝密度之间的定量关系

聚(Ñ -isopropylacrylamide--丙烯酰胺)(PNIAM-接枝到组织培养聚苯乙烯表面(TCPSs)具有不同厚度和密度的接枝-AM)通过改变旋涂速度和UV照射时间为细胞片使用制备工程。认为PNIAM移植表面的厚度小于30 nm,会影响蛋白质粘附和细胞附着。然而,用于确定薄表面的厚度(纳米级)的方法仍然是挑战。在这项研究中,开发了一个模型来关联PNIAM- co的厚度‐AM膜的接枝密度。椭圆偏振光谱仪(SE)和衰减全反射傅里叶变换红外光谱仪(ATR-FTIR)以及同步加速器辐射分别用于量化厚度和接枝密度。通过将波数1,654至1,600 cm -1(A 1,654 / A 1,600)处的信号与已知接枝密度相关联,从定量ATR-FTIR确定接枝共聚物的量。SE和ATR-FTIR的组合被用于构建线性模型(ħ = 6.29 σ + 2.24),得到接枝密度(σ从膜厚()ħ)与[R 2= 0.93。为了验证模型,准备了具有不同厚度和接枝密度的随机样品。线性模型用于预测接枝密度,该值几乎等于测量值。
更新日期:2021-01-14
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