A compact and robust physically unclonable function (PUF) for secure key generation is proposed. With the help of a cross-coupled amplifier, the leakage-current mismatch between the two transistors was digitised to produce a unique chip identification. The measurement results show that the proposed PUF has the best-in-class randomness and uniqueness, as well as the following features: (i) an ultra-small PUF cell with a minimum feature size of 159 F ² , being the lowest reported to date in CMOS, (ii) a low native BER (bit-instability) of 0.16% (0.89%) was measured at the golden condition, and (iii) an autocorrelation of 0.007 at 95% confidence was achieved.

中文翻译：

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0.67-μm的²与65纳米的0.89％的天然位不稳定基泄漏/位单元的双晶体管物理不可克隆功能块

提出了一种紧凑且健壮的物理不可克隆功能（PUF），用于安全密钥生成。在交叉耦合放大器的帮助下，两个晶体管之间的漏电流失配被数字化以产生唯一的芯片标识。测量结果表明，所提出的PUF具有同类最佳的随机性和唯一性，并具有以下特征：（i）具有最小特征尺寸为159 F ²的超小型PUF电池， 据报道是最低的在CMOS中，（ii）在黄金条件下测得的本机BER（位不稳定性）较低，为0.16％（0.89％），并且（iii）在95％置信度下实现了0.007的自相关。