In this work, zinc oxide (ZnO) thin films have been deposited on glass substrate using a simple and inexpensive multi-step sol–gel spin coating method at annealing temperatures of 300, 400, 500 and 600 °C in an open atmosphere. The influence of annealing on structural, photoluminescence and photoconductivity properties of ZnO thin films has been systematically investigated. X-ray diffraction pattern reveals that all ZnO thin films are polycrystalline with hexagonal wurtzite structure. Scanning electron micrograph depicted the formation of ZnO nanofibrous structure. Photoluminescence properties of ZnO thin films have been investigated by photoluminescence spectroscopy at room temperature. Photoconductivity properties have been investigated in terms of several parameters such as voltage dependence of photocurrent and dark current as well as time-resolved rise and decay of photocurrent. The rise and decay spectra under periodic illumination show reproducible and stable photoresponse. The synthesized ZnO thin film seems to be having potential use in UV–Vis photodetectors.

在这项工作中，氧化锌（ZnO）薄膜已通过一种简单且廉价的多步溶胶-凝胶旋涂方法在开放气氛中以300、400、500和600°C的退火温度沉积在玻璃基板上。已经系统地研究了退火对ZnO薄膜的结构，光致发光和光电导性能的影响。X射线衍射图表明，所有ZnO薄膜都是具有六方纤锌矿结构的多晶。扫描电子显微镜照片描绘了ZnO纳米纤维结构的形成。ZnO薄膜的光致发光特性已经在室温下通过光致发光光谱进行了研究。已经根据几个参数研究了光电导特性，例如光电流和暗电流的电压依赖性以及光电流的时间分辨上升和下降。周期性照射下的上升和下降光谱显示出可再现且稳定的光响应。合成的ZnO薄膜似乎在UV-Vis光电探测器中具有潜在用途。