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Hard x-ray single-shot spectrometer at the European X-ray Free-Electron Laser
Review of Scientific Instruments ( IF 1.6 ) Pub Date : 2020-10-01 , DOI: 10.1063/5.0019935
Naresh Kujala 1 , Wolfgang Freund 1 , Jia Liu 1 , Andreas Koch 1 , Torben Falk 1 , Marc Planas 1 , Florian Dietrich 1 , Joakim Laksman 1 , Theophilos Maltezopoulos 1 , Johannes Risch 1 , Fabio Dall’Antonia 1 , Jan Grünert 1
Affiliation  

The European X-ray Free-Electron Laser Facility in Germany delivers x-ray pulses with femtosecond pulse duration at a repetition rate of up to 4.5 MHz. The free-electron laser radiation is created by the self-amplified spontaneous emission (SASE) process, whose stochastic nature gives rise to shot-to-shot fluctuations in most beam properties, including spectrum, pulse energy, spatial profile, wavefront, and temporal profile. Each spectrum consisting of many spikes varies in width and amplitude that appear differently within the envelope of the SASE spectrum. In order to measure and study the SASE spectrum, the HIgh REsolution hard X-ray single-shot (HIREX) spectrometer was installed in the photon tunnel of the SASE1 undulator beamline. It is based on diamond gratings, bent crystals as a dispersive element, and a MHz-repetition-rate strip detector. It covers a photon energy range of 3 keV-25 keV and a bandwidth of 0.5% of the SASE beam. The SASE spikes are resolved with 0.15 eV separation using the Si 440 reflection, providing a resolving power of 60 000 at a photon energy of 9.3 keV. The measured SASE bandwidth is 25 eV. In this paper, we discuss the design specifications, installation, and commissioning of the HIREX spectrometer. The spectral results using Si (110), Si (111), and C (110) crystals are presented.

中文翻译:

欧洲 X 射线自由电子激光器的硬 X 射线单次发射光谱仪

位于德国的欧洲 X 射线自由电子激光器设施以高达 4.5 MHz 的重复率提供具有飞秒脉冲持续时间的 X 射线脉冲。自由电子激光辐射是由自放大自发辐射 (SASE) 过程产生的,其随机性质会导致大多数光束特性的逐次波动,包括​​光谱、脉冲能量、空间分布、波前和时间轮廓。每个由许多尖峰组成的频谱在 SASE 频谱的包络内出现不同的宽度和幅度。为了测量和研究 SASE 光谱,在 SASE1 波荡器光束线的光子隧道中安装了高分辨率硬 X 射线单次(HIREX)光谱仪。它基于金刚石光栅、作为色散元件的弯曲晶体和 MHz 重复率条形探测器。它涵盖了 3 keV-25 keV 的光子能量范围和 SASE 光束的 0.5% 的带宽。SASE 尖峰使用 Si 440 反射以 0.15 eV 的间隔分辨,在 9.3 keV 的光子能量下提供 60 000 的分辨能力。测得的 SASE 带宽为 25 eV。在本文中,我们讨论了 HIREX 光谱仪的设计规范、安装和调试。提供了使用 Si (110)、Si (111) 和 C (110) 晶体的光谱结果。并调试 HIREX 光谱仪。提供了使用 Si (110)、Si (111) 和 C (110) 晶体的光谱结果。并调试 HIREX 光谱仪。提供了使用 Si (110)、Si (111) 和 C (110) 晶体的光谱结果。
更新日期:2020-10-01
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