ABSTRACT Morphological, electrical and dielectric properties of manganese-doped lanthanide orthoferrites La0.6Ga0.4Fe1-xMnxO3 (x = 0; 0.1; 0.2 and 0.3) are investigated. Scanning electron microscopy characterization shows that the increase of Mn content increases the rate of the agglomeration and leads to grains with irregular shape. The grain size is estimated and compared with those obtained from X-ray diffraction result. Electrical measurements show that the resistivity decreases with Mn concentration over more than three decades. Also, it is found that dielectric properties are strongly temperature and frequency dependent. The dielectric constant reaches a high value at low frequency. Then, it decreases due to the polarization reduction. The dielectric transition peak appears at the same temperature for different frequencies for the undoped sample La0.6Ga0.4FeO3, while for the doped ones, the peak shifts to the higher temperatures as the frequency increases. Also, dielectric loss decreases with the frequency and a dispersion phenomenon appears.

中文翻译：

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La0.6Ga0.4Fe1-xMnxO3陶瓷的形貌、电学和介电性能

摘要 研究了掺杂锰的镧系元素正铁氧体 La0.6Ga0.4Fe1-xMnxO3 (x = 0; 0.1; 0.2 和 0.3) 的形态、电学和介电性能。扫描电镜表征表明，Mn 含量的增加会增加团聚速率并导致晶粒形状不规则。估计晶粒尺寸并与从 X 射线衍射结果获得的晶粒尺寸进行比较。电测量显示电阻率随着 Mn 浓度的增加而降低超过 30 年。此外，还发现介电特性强烈依赖于温度和频率。介电常数在低频时达到很高的值。然后，它由于极化减少而减少。对于未掺杂的样品 La0.6Ga0.4FeO3，不同频率的介电跃迁峰出现在相同温度下，而对于掺杂样品，随着频率的增加，峰向更高的温度移动。此外，介电损耗随频率降低，出现色散现象。