Abstract

An important stage in the design of electronic circuits of various classes and purposes is the calculation of the zero-level instability of a developed device under the influence exerted on the parameters of its components by external disturbances (variations in temperature, humidity, pressure, radiation, etc.), as well as by technological variations in these parameters in the course of serial manufacturing. A mathematical description of the problem of calculating the zero-level instability of an electronic circuit is constructed for the common case when the coordinates of operating points of all circuit components are known and the task is to find their deviations under variations in the parameters of circuit components caused by external disturbances, as well as under technological variations in these parameters in the course of manufacturing. An advantage of the proposed technique is that it avoids multiple calculations of a nonlinear circuit and its sensitivity to parameter variations, instead dealing with a mathematical description of the linearized circuit, which is used to determine the deviations of variables from their initial stationary values. As a result, the amount of computational operations is dramatically reduced and the computation time is reduced as well, which is especially important for solving optimization problems in electronic circuit design.

中文翻译：

---

参数和外部干扰变化下电子电路零电平不稳定性的计算方法

摘要

各种类别和用途的电子电路设计中的一个重要阶段是，在外部干扰（温度，湿度，压力，辐射的变化）对其组件的参数产生影响的情况下，计算已开发设备的零电平不稳定性等），以及在批量生产过程中这些参数的技术变化。当已知所有电路组件的工作点的坐标并且任务是在电路参数变化的情况下找到它们的偏差时，通常情况下，对计算电子电路的零电平不稳定性问题进行数学描述。由外部干扰以及制造过程中这些参数的技术变化引起的组件。所提出的技术的优点在于，它避免了对非线性电路及其对参数变化的敏感性的多次计算，而是处理了线性化电路的数学描述，该数学描述用于确定变量与其初始固定值的偏差。结果，大大减少了计算操作量，并且也减少了计算时间，这对于解决电子电路设计中的优化问题尤其重要。