当前位置：
X-MOL 学术
›
J. Instrum.
›
论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Triple-GEM discharge probability studies at CHARM: simulations and experimental results
Journal of Instrumentation ( IF 1.3 ) Pub Date : 2020-10-15 , DOI: 10.1088/1748-0221/15/10/p10013 M. Abbas 1 , M. Abbrescia 2 , H. Abdalla 3, 4 , A. Abdelalim 3, 5 , S. AbuZeid 3, 6 , A. Agapitos 7 , A. Ahmad 8 , A. Ahmed 9 , W. Ahmed 8 , C. Aim 10 , I. Asghar 8 , P. Aspell 11 , C. Avila 12 , J. Babbar 13 , Y. Ban 7 , R. Band 14 , S. Bansal 13 , L. Benussi 15 , V. Bhatnagar 13 , M. Bianco 11 , S. Bianco 15 , K. Black 16 , L. Borgonovi 17 , O. Bouhali 18 , A. Braghieri 10 , S. Braibant 17 , S. Butalla 19 , S. Calzaferri 10 , M. Caponero 15 , F. Cassese 20 , N. Cavallo 20 , S. Chauhan 13 , S. Colafranceschi 19 , A. Colaleo 2 , A. Conde Garcia 11 , M. Dalchenko 21 , A. De Iorio 20 , G. De Lentdecker 22 , D. Dell Olio 2 , G. De Robertis 2 , W. Dharmaratna 23 , S. Dildick 21 , B. Dorney 22 , R. Erbacher 14 , F. Fabozzi 20 , F. Fallavollita 11 , A. Ferraro 10 , D. Fiorina 10 , E. Fontanesi 17 , M. Franco 2 , C. Galloni 16 , P. Giacomelli 17 , S. Gigli 10 , J. Gilmore 21 , M. Gola 9 , M. Gruchala 11 , A. Gutierrez 24 , R. Hadjiiska 25 , T. Hakkarainen 26 , J. Hauser 27 , K. Hoepfner 28 , M. Hohlmann 19 , H. Hoorani 8 , T. Huang 21 , P. Iaydjiev 25 , A. Irshad 22 , A. Iorio 20 , J. Jaramillo 29 , D. Jeong 30 , V. Jha 31 , A. Juodagalvis 32 , E. Juska 21 , B. Kailasapathy 33 , T. Kamon 21 , P. Karchin 24 , A. Kaur 13 , H. Kaur 13 , H. Keller 28 , H. Kim 21 , J. Kim 34 , A. Kumar 9 , S. Kumar 13 , H. Kumawat 31 , N. Lacalamita 2 , J.S.H. Lee 30 , A. Levin 7 , Q. Li 7 , F. Licciulli 2 , L. Lista 20 , K. Liyanage 23 , F. Loddo 2 , M. Lohan 13 , M. Luhach 13 , M. Maggi 2 , N. Majumdar 35 , K. Malagalage 33 , S. Malhorta 18 , S. Martiradonna 2 , N. Mccoll 27 , C. McLean 14 , J. Merlin 2 , D. Mishra 31 , G. Mocellin 28 , L. Moureaux 22 , A. Muhammad 8 , S. Muhammad 8 , S. Mukhopadhyay 35 , M. Naimuddin 9 , P. Netrakanti 31 , S. Nuzzo 2 , R. Oliveira 11 , L. Pant 31 , P. Paolucci 20 , I.C. Park 30 , L. Passamonti 15 , G. Passeggio 20 , A. Peck 27 , N. Perera 23 , L. Petre 22 , H. Petrow 26 , D. Piccolo 15 , D. Pierluigi 15 , G. Raffone 15 , M. Rahmani 19 , F. Ramirez 29 , A. Ranieri 2 , G. Rashevski 25 , M. Ressegotti 10 , C. Riccardi 10 , M. Rodozov 25 , E. Romano 10 , C. Roskas 36 , B. Rossi 20 , P. Rout 35 , J.D. Ruiz 29 , A. Russo 15 , A. Safonov 21 , D. Saltzberg 27 , G. Saviano 15 , A. Shah 9 , A. Sharma 11 , R. Sharma 9 , M. Shopova 25 , F. Simone 2 , J. Singh 13 , E. Soldani 2 , U. Sonnadara 33 , E. Starling 22 , B. Stone 27 , J. Sturdy 24 , G. Sultanov 25 , Z. Szillasi 37 , D. Teague 16 , D. Teyssier 37 , T. Tuuva 26 , M. Tytgat 36 , I. Vai 38 , N. Vanegas 29 , R. Venditti 2 , P. Verwilligen 2 , W. Vetens 16 , A. Virdi 13 , P. Vitulo 10 , A. Wajid 8 , D. Wang 7 , K. Wang 7 , I. Watson 30 , N. Wickramage 23 , D.D.C. Wickramarathna 33 , Y. Yang 22 , U. Yang 34 , J. Yongho 39 , I. Yoon 34 , Z. You 40 , I. Yu 39 , S. Zaleski 28
Journal of Instrumentation ( IF 1.3 ) Pub Date : 2020-10-15 , DOI: 10.1088/1748-0221/15/10/p10013 M. Abbas 1 , M. Abbrescia 2 , H. Abdalla 3, 4 , A. Abdelalim 3, 5 , S. AbuZeid 3, 6 , A. Agapitos 7 , A. Ahmad 8 , A. Ahmed 9 , W. Ahmed 8 , C. Aim 10 , I. Asghar 8 , P. Aspell 11 , C. Avila 12 , J. Babbar 13 , Y. Ban 7 , R. Band 14 , S. Bansal 13 , L. Benussi 15 , V. Bhatnagar 13 , M. Bianco 11 , S. Bianco 15 , K. Black 16 , L. Borgonovi 17 , O. Bouhali 18 , A. Braghieri 10 , S. Braibant 17 , S. Butalla 19 , S. Calzaferri 10 , M. Caponero 15 , F. Cassese 20 , N. Cavallo 20 , S. Chauhan 13 , S. Colafranceschi 19 , A. Colaleo 2 , A. Conde Garcia 11 , M. Dalchenko 21 , A. De Iorio 20 , G. De Lentdecker 22 , D. Dell Olio 2 , G. De Robertis 2 , W. Dharmaratna 23 , S. Dildick 21 , B. Dorney 22 , R. Erbacher 14 , F. Fabozzi 20 , F. Fallavollita 11 , A. Ferraro 10 , D. Fiorina 10 , E. Fontanesi 17 , M. Franco 2 , C. Galloni 16 , P. Giacomelli 17 , S. Gigli 10 , J. Gilmore 21 , M. Gola 9 , M. Gruchala 11 , A. Gutierrez 24 , R. Hadjiiska 25 , T. Hakkarainen 26 , J. Hauser 27 , K. Hoepfner 28 , M. Hohlmann 19 , H. Hoorani 8 , T. Huang 21 , P. Iaydjiev 25 , A. Irshad 22 , A. Iorio 20 , J. Jaramillo 29 , D. Jeong 30 , V. Jha 31 , A. Juodagalvis 32 , E. Juska 21 , B. Kailasapathy 33 , T. Kamon 21 , P. Karchin 24 , A. Kaur 13 , H. Kaur 13 , H. Keller 28 , H. Kim 21 , J. Kim 34 , A. Kumar 9 , S. Kumar 13 , H. Kumawat 31 , N. Lacalamita 2 , J.S.H. Lee 30 , A. Levin 7 , Q. Li 7 , F. Licciulli 2 , L. Lista 20 , K. Liyanage 23 , F. Loddo 2 , M. Lohan 13 , M. Luhach 13 , M. Maggi 2 , N. Majumdar 35 , K. Malagalage 33 , S. Malhorta 18 , S. Martiradonna 2 , N. Mccoll 27 , C. McLean 14 , J. Merlin 2 , D. Mishra 31 , G. Mocellin 28 , L. Moureaux 22 , A. Muhammad 8 , S. Muhammad 8 , S. Mukhopadhyay 35 , M. Naimuddin 9 , P. Netrakanti 31 , S. Nuzzo 2 , R. Oliveira 11 , L. Pant 31 , P. Paolucci 20 , I.C. Park 30 , L. Passamonti 15 , G. Passeggio 20 , A. Peck 27 , N. Perera 23 , L. Petre 22 , H. Petrow 26 , D. Piccolo 15 , D. Pierluigi 15 , G. Raffone 15 , M. Rahmani 19 , F. Ramirez 29 , A. Ranieri 2 , G. Rashevski 25 , M. Ressegotti 10 , C. Riccardi 10 , M. Rodozov 25 , E. Romano 10 , C. Roskas 36 , B. Rossi 20 , P. Rout 35 , J.D. Ruiz 29 , A. Russo 15 , A. Safonov 21 , D. Saltzberg 27 , G. Saviano 15 , A. Shah 9 , A. Sharma 11 , R. Sharma 9 , M. Shopova 25 , F. Simone 2 , J. Singh 13 , E. Soldani 2 , U. Sonnadara 33 , E. Starling 22 , B. Stone 27 , J. Sturdy 24 , G. Sultanov 25 , Z. Szillasi 37 , D. Teague 16 , D. Teyssier 37 , T. Tuuva 26 , M. Tytgat 36 , I. Vai 38 , N. Vanegas 29 , R. Venditti 2 , P. Verwilligen 2 , W. Vetens 16 , A. Virdi 13 , P. Vitulo 10 , A. Wajid 8 , D. Wang 7 , K. Wang 7 , I. Watson 30 , N. Wickramage 23 , D.D.C. Wickramarathna 33 , Y. Yang 22 , U. Yang 34 , J. Yongho 39 , I. Yoon 34 , Z. You 40 , I. Yu 39 , S. Zaleski 28
Affiliation
The CMS muon system in the region with 2.03<|η|<2.82 is characterized by a very harsh radiation environment which can generate hit rates up to 144 kHz/cm$^{2}$ and an integrated charge of 8 C/cm$^{2}$ over ten years of operation. In order to increase the detector performance and acceptance for physics events including muons, a new muon station (ME0) has been proposed for installation in that region. The technology proposed is Triple—Gas Electron Multiplier (Triple-GEM), which has already been qualified for the operation in the CMS muon system. However, an additional set of studies focused on the discharge probability is necessary for the ME0 station, because of the large radiation environment mentioned above. A test was carried out in 2017 at the Cern High energy AcceleRator Mixed (CHARM) facility, with the aim of giving an estimation of the discharge probability of Triple-GEM detectors in a very intense radiation field environment, similar to the one of the CMS muon system. A dedicated standalone Geant4 simulation was performed simultaneously, to evaluate the behavior expected in the detector exposed to the CHARM field. The geometry of the detector has been carefully reproduced, as well as the background field present in the facility. This paper presents the results obtained from the Geant4 simulation, in terms of sensitivity of the detector to the CHARM environment, together with the analysis of the energy deposited in the gaps and of the processes developed inside the detector. The discharge probability test performed at CHARM will be presented, with a complete discussion of the results obtained, which turn out to be consistent with measurements performed by other groups.
中文翻译：
CHARM 的 Triple-GEM 放电概率研究：模拟和实验结果
2.03<|η|<2.82区域的CMS μ子系统的特点是辐射环境非常恶劣，可以产生高达144 kHz/cm$^{2}$的命中率和8 C/cm$的综合电荷^{2}$ 超过十年的运营。为了提高探测器的性能和对包括 μ 子在内的物理事件的接受度，建议在该区域安装一个新的 μ 子站 (ME0)。提出的技术是三重气体电子倍增器（Triple-GEM），该技术已经可以在CMS μ子系统中运行。然而，由于上述大辐射环境，ME0 站需要针对放电概率进行额外的一组研究。2017 年在欧洲核子研究中心高能加速器混合 (CHARM) 设施中进行了一项测试，目的是估计 Triple-GEM 探测器在非常强的辐射场环境中的放电概率，类似于 CMS 介子系统之一。同时执行专用的独立 Geant4 模拟，以评估暴露于 CHARM 场的探测器的预期行为。探测器的几何形状以及设施中存在的背景场都经过仔细复制。本文介绍了从 Geant4 模拟获得的结果，包括探测器对 CHARM 环境的灵敏度，以及对沉积在间隙中的能量和探测器内部发展过程的分析。将介绍在 CHARM 进行的放电概率测试，并对获得的结果进行完整的讨论，
更新日期：2020-10-15
中文翻译：
CHARM 的 Triple-GEM 放电概率研究：模拟和实验结果
2.03<|η|<2.82区域的CMS μ子系统的特点是辐射环境非常恶劣，可以产生高达144 kHz/cm$^{2}$的命中率和8 C/cm$的综合电荷^{2}$ 超过十年的运营。为了提高探测器的性能和对包括 μ 子在内的物理事件的接受度，建议在该区域安装一个新的 μ 子站 (ME0)。提出的技术是三重气体电子倍增器（Triple-GEM），该技术已经可以在CMS μ子系统中运行。然而，由于上述大辐射环境，ME0 站需要针对放电概率进行额外的一组研究。2017 年在欧洲核子研究中心高能加速器混合 (CHARM) 设施中进行了一项测试，目的是估计 Triple-GEM 探测器在非常强的辐射场环境中的放电概率，类似于 CMS 介子系统之一。同时执行专用的独立 Geant4 模拟，以评估暴露于 CHARM 场的探测器的预期行为。探测器的几何形状以及设施中存在的背景场都经过仔细复制。本文介绍了从 Geant4 模拟获得的结果，包括探测器对 CHARM 环境的灵敏度，以及对沉积在间隙中的能量和探测器内部发展过程的分析。将介绍在 CHARM 进行的放电概率测试，并对获得的结果进行完整的讨论，
京公网安备 11010802027423号