The aim of this work was the determination of the basic optical parameters and electronic structure of conjugated polymer films by two commonly used techniques—spectrophotometry and ellipsometry. Poly(3-hexylthiophene (P3HT) and poly(3-octylthiophene (P3OT) conductive polymers films deposited on a glass substrate by the spin-coating technique showed very comparable surface structures composed of grains of similar sizes and shapes. X-ray tests confirmed that the polythiophene layers are amorphous, which confirmed the correctness of the choice of the optical models used. Selected optical models (Lorentz, Tauc–Lorentz and Cody–Lorentz) have been applied in order to determine the thickness, and optical parameters such as refractive index and extinction coefficient, absolute absorption and electronic parameters (energy gap E_g, amplitude A and broadening B). Spectral absorption determined from spectrophotometric measurement is similar to the absorption spectrum obtained from the ellipsometry method with the application of oscillator models.

中文翻译：

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椭偏光度法和分光光度法测定非晶态有机薄膜的电子参数

这项工作的目的是通过两种常用技术（分光光度法和椭圆光度法）测定共轭聚合物薄膜的基本光学参数和电子结构。通过旋涂技术沉积在玻璃基板上的聚（3-己基噻吩（P3HT）和聚（3-辛基噻吩（P3OT））导电聚合物薄膜显示出非常相似的表面结构，该表面结构由大小和形状相似的晶粒组成，X射线测试证实聚噻吩层是无定形的，这证实了所用光学模型的选择的正确性，已选择了光学模型（洛伦兹，陶克-洛伦兹和科迪-洛伦兹）来确定厚度和光学参数，例如折射指数和消光系数，绝对吸收和电子参数（能隙E_g，振幅A和加宽B）。通过分光光度法测量确定的光谱吸收与使用振荡器模型从椭圆偏振法获得的吸收光谱相似。