A switching characterization (SC) test of power semiconductor devices (PSDs) gives us significant insight into the dynamic switching behavior of the device under various operating conditions. A double pulse test (DPT) is a widely used method for evaluating switching performance parameters of a PSD such as its switching losses, switching speed ( di/dt , dv/dt ), turn-on and turn-off times etc. The scientific information obtained from analysis of DPT results of a PSD helps in predicting its thermo-electric performance in a target power electronic converter. With conventional DPT setups, it is a time-consuming and error-prone process to manually conduct these tests under several permutations of test parameters and thereafter analyze the experimental data manually. This work presents a newly developed automated SC test system, which can run tests one after another, once the desired test parameters are entered in a graphic user interface. The test-control system also enables recording and systematic processing of the experimental switching data to deliver usable characterization results. The automatic, compact and modular design allows the proposed SC test platform to stand out from the conventional DPT setups. The design principles are experimentally verified by implementing a hardware prototype capable of testing PSDs up to 1000 V, 60 A, 250 °C.

中文翻译：

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提取开关损耗并创建功率半导体数据库的自动系统的概念设计和演示

功率半导体器件（PSD）的开关特性（SC）测试使我们对各种工作条件下器件的动态开关行为有了深入的了解。双脉冲测试（DPT）是一种用于评估PSD开关性能参数（例如其开关损耗，开关速度（ di / dt ， dv / dt 从PSD的DPT结果分析中获得的科学信息有助于预测其在目标功率电子转换器中的热电性能。使用常规DPT设置，在多个测试参数排列下手动执行这些测试，然后手动分析实验数据是一个耗时且容易出错的过程。这项工作提出了一种新开发的自动SC测试系统，一旦在图形用户界面中输入了所需的测试参数，就可以一次又一次运行测试。测试控制系统还可以记录和系统处理实验开关数据，以提供可用的表征结果。自动 紧凑和模块化的设计使建议的SC测试平台与常规DPT设置脱颖而出。通过实现能够测试高达1000 V，60 A，250°C的PSD的硬件原型，实验原理验证了设计原理。