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A quantitative analysis of AES and XPS specifically applied in adsorption systems at submonolayer regime
Surface and Interface Analysis ( IF 1.7 ) Pub Date : 2020-10-12 , DOI: 10.1002/sia.6893
Dimitrios Vlachos 1
Affiliation  

An analysis of the intensity ratios, adsorbate over substrate and substrate over the clean one, is carried out, treating them as a system of two independent variables. This leads to simple formulas, ready to be applied to the determination of coverage up to the monolayer point, if elemental bulk standards are available. The procedure allows one more parameter to be found out compared with previous treatments. Formulas are produced for polycrystalline and single crystal elemental bulk standards. The coverage thus calculated turns out to be a function of the intensity from the adsorbate over that from the clean substrate. The analysis is applied successfully to the adsorption of Ba on the Ni(110) surface at submonolayer regime.

中文翻译:

亚单层条件下专门用于吸附系统的AES和XPS的定量分析

进行强度比的分析,即基材上的被吸附物和干净的基材上的被吸附物,将它们视为两个独立变量的系统。如果可以得到基本的体积标准,这将导致简单的公式,准备用于确定单层点的覆盖率。与以前的治疗方法相比,该程序可以发现更多参数。为多晶和单晶元素块状标准品生产配方。由此计算出的覆盖率是来自被吸附物的强度相对于来自清洁基材的强度的函数。该分析已成功应用于亚单层态下Ba在Ni(110)表面的吸附。
更新日期:2020-10-12
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