Accurateyield estimation is of particular importance in microwave component design due to the presence of manufacturing tolerances. Coarse- and fine-mesh space mapping (SM) methodology has been regarded as a powerful tool for facilitating electromagnetic (EM)-based yield estimation, especially when equivalent circuit coarse models are not available. This letter proposes a novel EM-based yield estimation technique using mesh deformation-incorporated coarse- and fine-mesh SM. Through the incorporation of mesh deformation into coarse-mesh simulation, both the coarse-mesh EM responses and the coarse-mesh EM sensitivities change continuously as geometrical parameters change. This allows the proposed technique to use a coarser mesh in building the SM surrogate than the conventional SM technique, thereby accelerating the overall EM-based yield estimation process. The proposed yield estimation technique is demonstrated through two microwave examples.

中文翻译：

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使用网格变形结合的空间映射替代物对微波结构的有效产量估计

由于存在制造公差，准确的产量估计在微波组件设计中尤为重要。粗网格和细网格空间映射 (SM) 方法已被视为促进基于电磁 (EM) 的良率估计的强大工具，尤其是当等效电路粗模型不可用时。这封信提出了一种新的基于 EM 的产量估计技术，该技术使用结合了网格变形的粗网格和细网格 SM。通过将网格变形纳入粗网格模拟，粗网格 EM 响应和粗网格 EM 灵敏度随着几何参数的变化而不断变化。这允许所提出的技术在构建 SM 代理时使用比传统 SM 技术更粗的网格，从而加速基于 EM 的整体良率估算过程。通过两个微波示例演示了所提出的产量估算技术。