Angle‐resolved X‐ray fluorescence spectroscopy gives access to elemental analysis of nanoscaled materials. The two main techniques of this method are grazing incidence X‐ray fluorescence (GIXRF) and grazing emission X‐ray fluorescence (GEXRF) spectroscopy. Principles of both techniques including main applications are discussed in this Review. The main focus lies on the description of GEXRF technique and its new analytical possibilities in the nano‐world.

中文翻译：

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放牧的X射线荧光：纳米分析的新概念和应用

角度分辨X射线荧光光谱法可用于纳米级材料的元素分析。该方法的两种主要技术是掠入射X射线荧光（GIXRF）和掠射X射线荧光（GEXRF）光谱。这篇综述讨论了包括主要应用在内的两种技术的原理。主要关注点是GEXRF技术的描述及其在纳米世界中的新分析可能性。