We present a new approach to 3-dimensional chemical imaging based on X-ray computed micro tomography (CT), which enables the analysis of the internal elemental chemistry. The method uses a conventional laboratory-based CT scanner equipped with a semiconductor detector (CdTe). Based on the X-ray absorption spectra, elements in a sample can be distinguished by their specific K-edge energy. The capabilities and performance of this new approach are illustrated with different experiments, i.e. single pure element particle measurements, element differentiation in mixtures, and mineral differentiation in a natural rock sample. The results show that the method can distinguish elements with K-edges in the range of 20 to 160 keV, this corresponds to an element range from Ag to U. Furthermore, the spectral information allows a distinction between materials, which show little variation in contrast in the reconstructed CT image.

中文翻译：

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光谱 X 射线计算机显微断层扫描：3 维化学成像

我们提出了一种基于 X 射线计算机显微断层扫描 (CT) 的 3 维化学成像新方法，它能够分析内部元素化学。该方法使用配备半导体探测器 (CdTe) 的传统实验室 CT 扫描仪。根据 X 射线吸收光谱，样品中的元素可以通过其特定的 K 边能量来区分。这种新方法的能力和性能通过不同的实验来说明，即单一纯元素粒子测量、混合物中的元素差异以及天然岩石样品中的矿物差异。结果表明，该方法可以区分 K 边在 20 到 160 keV 范围内的元素，这对应于从 Ag 到 U 的元素范围。此外，光谱信息允许区分材料，