Electronics in automobiles must operate safely and have excellent reliability; however, components are often unreliable and cause product recalls. There is an urgent need to solve this problem. Conventionally, components are tested individually so it is not possible to simulate environmental failures. The purpose of this study was to utilize severe field-simulations and to propose determining environmental test sequence a 2-phase process for automotive electronics that satisfy the minimum severity for each leg and minimize the test cost. In this work, we examined international standards to understand testing sequences, and calculated the severity of ISO 16750 test items, based on an analytic hierarchy process. The modeled functions were established, and test sequences were optimized using a genetic algorithm. The proposed test sequence was based on the results of this analysis by assumed real conditions. Additionally, the variance analysis was performed for the affected total cost to find factors about determined test sequences. Finally, significant test sequences of ISO 16750 were partially presented by analyzing the results for applying in the automotive industry.

汽车中的电子设备必须安全运行并具有出色的可靠性；但是，组件通常不可靠，并会导致产品召回。迫切需要解决这个问题。常规上，对组件进行单独测试，因此无法模拟环境故障。这项研究的目的是利用严格的现场模拟，并提出确定环境测试顺序的汽车电子设备的两阶段过程，该过程应满足每条支路的最低严重性并最小化测试成本。在这项工作中，我们检查了国际标准以了解测试顺序，并基于层次分析法计算了ISO 16750测试项目的严重性。建立了建模功能，并使用遗传算法优化了测试序列。建议的测试顺序是基于假定实际条件的分析结果。此外，对受影响的总成本进行了方差分析，以找到有关确定的测试序列的因素。最后，通过分析在汽车行业中应用的结果，部分介绍了ISO 16750的重要测试序列。