Organic materials are highly sensitive to electron beam irradiation and thus easily damaged upon imaging by electron microscopy. Now, low-dose aberration-corrected high resolution transmission electron microscopy allows for less invasive near-atomic-scale imaging of a two-dimensional polymer.

中文翻译：

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二维聚合物中的晶界成像

有机材料对电子束辐射高度敏感，因此在电子显微镜成像时很容易损坏。现在，低剂量像差校正高分辨率透射电子显微镜允许对二维聚合物进行侵入性较小的近原子级成像。