Abstract Ceramic samples of the ternary 0.5Y0.1Zr0.9O2 − 0.5(0.6SrTiO3 − 0.4BiScO3) system consisting of the individual Y0.1Zr0.9O2 and 0.6SrTiO3 − 0.4BiScO3 subsystems were synthesized using solid-state processing techniques. Coexistence of the tetragonal P42/nmc phase characteristic of the 5Y0.1Zr0.9O2 subsystem and the cubic and tetragonal P4mm phases characteristic of the 0.6SrTiO3 − 0.4BiScO3 subsystem was found at room temperature via the XRD analysis. An examination of the dielectric properties showed anomalous changes within three temperature fields. The dielectric anomalies corresponding to the lowest temperature field (below room temperature) are associated with a diffuse ferroelectric phase transition. Mean temperature dielectric anomalies are corresponding to a dielectric relaxation process. The temperature position of these anomalies strongly depends on a measuring frequency and falls in the temperature 600 ÷ 900 K range. High temperature dielectric anomalies induced an ionic conductivity are observed above ∼900 K.

中文翻译：

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0.5Y0.1Zr0.9O2-0.5(0.6SrTiO3-0.4BiScO3)系陶瓷介电性能

摘要 由单独的 Y0.1Zr0.9O2 和 0.6SrTiO3 - 0.4BiScO3 子系统组成的三元 0.5Y0.1Zr0.9O2 − 0.5(0.6SrTiO3 − 0.4BiScO3) 系统的陶瓷样品使用固态处理技术合成。通过 XRD 分析发现在室温下 5Y0.1Zr0.9O2 子系统的四方 P42/nmc 相特征与 0.6SrTiO3 - 0.4BiScO3 子系统的立方和四方 P4mm 相特征共存。介电特性的检查显示三个温度场内的异常变化。对应于最低温度场（低于室温）的介电异常与扩散铁电相变有关。平均温度介电异常对应于介电弛豫过程。这些异常的温度位置在很大程度上取决于测量频率并且落在温度 600 ÷ 900 K 范围内。在约 900 K 以上观察到高温介电异常引起离子电导率。