Abstract

Powders of metals (magnesium and tungsten) and nonmetals (boron and silicon) are used to analyze Fluralit-4 Teflon (polytetrafluoroethylene) powder by means of surface-activated laser desorption/ionization. It is shown that this technique allows the degree of Teflon degradation to be determined. It is established that when silicon powder is used as a matrix, it is possible to register both low molecular weight products of the degradation of Teflon and its oligomeric products in the range of up to 1400 Da. The Teflon mass spectra contain two series of ions: one for saturated components and one for unsaturated components.

中文翻译：

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通过表面活化的激光解吸/电离作用的特氟龙降解产物的质谱研究

摘要

金属（镁和钨）和非金属（硼和硅）粉末用于通过表面活化的激光解吸/电离分析Fluralit-4 Teflon（聚四氟乙烯）粉末。结果表明，该技术可以确定特氟隆的降解程度。已经确定，当将硅粉用作基质时，可以记录铁氟龙降解的低分子量产物及其低聚产物，最高可达1400 Da。特富龙质谱包含两个系列的离子：一个用于饱和组分，一个用于不饱和组分。