Measurement of electron energy spectra of dielectrics is a challenge due to charging issues. This article presents experimental results of electron energy spectra of dielectric materials under electron irradiation obtained by transforming the charging process into a spectroscopic tool. The technique was verified on conductive materials in a previous paper. This method is based on capturing the charging transient of the secondary electron emission current. Dielectric materials are irradiated with a single train of pulses of monoenergetic electrons. The evolution of the number of emitted electrons as a function of time is measured. The rate of this evolution coupled to the arising potential on the surface of the material conveys the energy at which the secondary electrons are emitted. The total incident dose used in this method is about 10 pC/mm², in contrast to the high doses required when other common methods are utilized. The use of low doses ensures a minimal distortion of the pristine state of the dielectric material by avoiding radiation damage, deep charging, defects, aging and other electron induced phenomena in the insulator. This method was applied to obtain the secondary electron energy spectra of the Kapton, Teflon, and Ultem polymers.

由于充电问题，电介质电子能谱的测量是一个挑战。本文介绍了通过将充电过程转变为光谱工具获得的，在电子辐照下介电材料的电子能谱的实验结果。该技术在先前的论文中已在导电材料上得到验证。该方法基于捕获二次电子发射电流的充电瞬变。用单列单能电子脉冲辐照介电材料。测量了发射电子的数量随时间的变化。这种演化的速率与材料表面上上升的电位耦合，传递了次级电子被发射的能量。此方法中使用的总入射剂量约为10 pC / mm与使用其他常见方法时所需的高剂量相反，图^2所示。低剂量的使用通过避免绝缘体中的辐射损坏，深度充电，缺陷，老化和其他电子感应现象，确保了电介质材料原始状态的最小变形。该方法用于获得Kapton，Teflon和Ultem聚合物的二次电子能谱。