Applying pressure on a material can reveal many physical properties and is a very efficient tool to understand its physics. Resistivity measurements have been the ideal probe to study metals under pressure. However, in the case of insulators, resistivity, or conductivity, it is often not the appropriate quantity characterizing the material. In this work, we present a newly developed in situ pressure tuning system that can be used over a wide temperature range (2 K-300 K) and allows changing the pressure at any temperature. We also present AC calorimetry and capacitance/loss measurements under pressure and demonstrate how this combination can be used to characterize a material that is too insulating for standard resistivity techniques.

中文翻译：

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在压力下探测绝缘体

对材料施加压力可以揭示许多物理特性，并且是了解其物理特性的非常有效的工具。电阻率测量是在压力下研究金属的理想探针。然而，在绝缘体、电阻率或电导率的情况下，它通常不是表征材料的适当数量。在这项工作中，我们提出了一种新开发的原位压力调谐系统，可以在很宽的温度范围 (2 K-300 K) 上使用，并允许在任何温度下改变压力。我们还介绍了交流量热法和压力下的电容/损耗测量，并展示了如何使用这种组合来表征对于标准电阻率技术而言绝缘性太强的材料。