Within the present work a peak analysis and unfolding method for low energy $\gamma$-ray spectroscopy is presented. This method can be used to facilitate the determination of the peak integral of a photopeak, when Ge X-ray escape peaks contaminate the latter and in parallel the source activity and the emission rate of the recorded photons which produce the escape peaks are unknown. It is based on extensive Monte Carlo simulations of the spectra by taking the full advantage of power and accuracy provided by the GEANT4 simulation toolkit.

中文翻译：

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使用GEANT4蒙特卡洛模拟解决低能耗问题 $\gamma$射线光谱： ${}^{164}{\text{何}}^{G+米}$ 使用宽能HPGe检测器衰减

在本工作中，针对低能量的峰分析和展开方法 $\gamma$射线光谱学。当Ge X射线逸出峰污染后者时，该方法可用于帮助确定光电峰的峰积分，与此同时，未知产生该逸出峰的光子的源活度和发射率也是未知的。它充分利用了GEANT4仿真工具包提供的强大功能和准确性，基于光谱的广泛蒙特卡洛模拟。