Under the condition of high counting rate, the phenomenon of nuclear pulse signal pile‐up using a single exponential impulse shaping method is still very serious, and leads to a severe loss in counting rate. A real nuclear pulse signal can be expressed as a dual‐exponential decay function with a certain rising edge. This paper proposes a new dual‐exponential impulse shaping method and shows its deployment in hardware to test its performance. The signal of a high‐performance silicon drift detector under high counting rate in an X‐ray fluorescence spectrometer is obtained. The result of the experiment shows that the new method can effectively shorten the dead‐time caused by nuclear signal pile‐up and correct the counting rate.

中文翻译：

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基于双指数脉冲整形的计数损耗校正方法

在高计数率的情况下，采用单指数脉冲整形方法的核脉冲信号堆积现象仍然很严重，导致计数率的严重损失。真实的核脉冲信号可以表示为具有一定上升沿的双指数衰减函数。本文提出了一种新的双指数脉冲整形方法，并展示了其在硬件中的部署以测试其性能。在X射线荧光光谱仪中获得了高计数率下的高性能硅漂移检测器的信号。实验结果表明，该新方法可以有效地缩短核信号堆积所引起的停滞时间，并能校正计数率。