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Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks
Journal of Electronic Testing ( IF 0.9 ) Pub Date : 2020-04-27 , DOI: 10.1007/s10836-020-05878-1
Biswajit Bhowmik

The networks-on-chip (NoCs) as the prevalent interconnection infrastructure have been continuously replacing the contemporary chip microprocessors (CMPs) while high performance computing is the dominant consideration. Aggressive technology scaling progressively reduces the feature size of the chips resulting in increasing susceptibility to failures and breakdowns due to open faults on communication channels. The reliability and performance issues are then becoming more critical requirement in both current and future NoC-based CMPs. This paper first presents an on-line, distributed built-in-self-test (BIST) oriented test mechanism that particularly detects open faults on communication channels and identifies faulty wires from the channels in NoCs. Next, a suitable test scheduling scheme is presented in order to reduce the overall test time and related performance overhead due the fault. Such scheduling scheme makes the present test solution scalable with large scale NoC architectures in general. Implementation of the test mechanism takes little hardware area and few clocks to detect the fault in channels. The on-line evaluation of the proposed test solution demonstrates the effect of the channel-open faults on the NoC performance characteristics at large real like synthetic traffic. In comparison to wide range of prior works on 16-bit networks, the present scheme provides many advantages, e.g., it improves hardware area overhead by 35.36–67.73% and saves the test time by 96.43%. packet latency and energy consumption by 5.83–42.79% and 6.24–46.38%, respectively on the networks, the proposed scheme becomes competitive with the existing works.

中文翻译:

片上通信网络中具有通道开路故障的最大连通性测试

片上网络 (NoC) 作为流行的互连基础设施一直在不断取代当代芯片微处理器 (CMP),而高性能计算是主要考虑因素。积极的技术扩展逐渐减小了芯片的特征尺寸,从而增加了由于通信通道上的开放故障而导致的故障和故障的敏感性。在当前和未来的基于 NoC 的 CMP 中,可靠性和性能问题变得越来越重要。本文首先介绍了一种面向在线分布式内置自测试 (BI​​ST) 的测试机制,该机制专门检测通信通道上的开放故障,并从 NoC 中的通道中识别出故障线路。下一个,提出了一个合适的测试调度方案,以减少由于故障导致的整体测试时间和相关性能开销。这样的调度方案使得当前的测试解决方案可扩展到一般的大规模 NoC 架构。测试机制的实现需要很少的硬件面积和很少的时钟来检测通道中的故障。所提出的测试解决方案的在线评估证明了通道开放故障对大型真实(如合成流量)NoC 性能特征的影响。与之前在 16 位网络上的广泛工作相比,本方案提供了许多优点,例如,它将硬件区域开销提高了 35.36-67.73%,并节省了 96.43% 的测试时间。网络上的数据包延迟和能耗分别降低了 5.83–42.79% 和 6.24–46.38%,
更新日期:2020-04-27
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