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Spectroscopic evaluation of tungsten carbide-titanium carbide composite prepared by arc plasma melting
Journal of Electron Spectroscopy and Related Phenomena ( IF 1.9 ) Pub Date : 2020-12-01 , DOI: 10.1016/j.elspec.2020.146993
Bijan Bihari Nayak , Tapan Dash , Subrata Pradhan

Abstract Tungsten carbide-titanium carbide composite of six different compositions (in the range 1−15 wt% TiC) prepared by arc plasma melting has been evaluated for the first time by spectroscopic methods such as X-ray photoelectron spectroscopy (XPS), micro Raman spectroscopy and Fourier transform infrared (FTIR) spectroscopy. From XPS, the presence of elements like W, Ti, C and O were identified unambiguously. The de-convoluted spectra of binding energy for W4f and C1s levels in XPS showed occurrence of different carbide phases of W. Raman spectra recorded in the range 100−3200 cm−1 identified various phases of tungsten carbide and titanium carbide, titanium sub-carbide, different phases of carbon (G, D, 2D) and oxide of tungsten (W O). FTIR, besides identifying TiC phase, detected the presence of aromatic carbon (C C) and O H stretching. Taking into account the findings from the three spectroscopic methods and comparing them with the XRD (X-ray diffraction) results, one concludes that WC phase totally disappears in the composite at higher TiC compositions (10−15 wt%). C as an independent phase ceases to appear in XRD in the 5−15 wt% TiC range of the composite. This happens due to change of graphitic C to sp2-rich amorphous C in the respective samples, as confirmed from XPS.

中文翻译:

电弧等离子体熔化制备碳化钨-碳化钛复合材料的光谱评价

摘要 利用 X 射线光电子能谱 (XPS)、显微拉曼光谱等光谱方法首次评估了通过电弧等离子体熔化制备的六种不同成分的碳化钨 - 碳化钛复合材料(在 1-15 wt% TiC 范围内)。光谱和傅里叶变换红外 (FTIR) 光谱。从 XPS 中,可以明确地识别出 W、Ti、C 和 O 等元素的存在。XPS 中 W4f 和 C1s 水平的结合能解卷积光谱显示 W 存在不同的碳化物相。拉曼光谱记录在 100-3200 cm-1 范围内,识别出碳化钨和碳化钛、亚碳化钛的各种相, 不同相的碳 (G, D, 2D) 和钨的氧化物 (WO)。FTIR 除了识别 TiC 相外,还检测到芳香碳 (CC) 和 OH 拉伸的存在。考虑到三种光谱方法的发现并将它们与 XRD(X 射线衍射)结果进行比较,可以得出结论,在更高的 TiC 组成(10-15 wt%)下,复合材料中的 WC 相完全消失。在复合材料的 5-15 wt% TiC 范围内,C 作为独立相不再出现在 XRD 中。正如 XPS 所证实的,这是由于各个样品中石墨 C 变为富含 sp2 的无定形 C 所致。
更新日期:2020-12-01
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