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Graphene: Facile Morphological Qualification of Transferred Graphene by Phase‐Shifting Interferometry (Adv. Mater. 38/2020)
Advanced Materials ( IF 29.4 ) Pub Date : 2020-09-21 , DOI: 10.1002/adma.202070288
Ukjae Lee 1 , Yun Sung Woo 2 , Yoojoong Han 1, 3 , Humberto R. Gutiérrez 4 , Un Jeong Kim 5 , Hyungbin Son 1
Affiliation  

In article number 2002854, Un Jeong Kim, Hyungbin Son, and co‐workers use phase‐shifting interferometry to quickly obtain morphological information of atomic‐scale structures on transferred graphene over a large area. The obtained morphological information includes wrinkles, various polymer residues, and tearing/opening of the transferred graphene, and it can be used to evaluate the quality of the transferred graphene, such as the physical integrity, thickness, and adhesive strength to the target substrate.
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中文翻译:

石墨烯:通过相移干涉术轻松地转移石墨烯的形态学鉴定(Adv。Mater。38/2020)

在编号2002854中,Un Jeong Kim,Hyungbin Son和他的同事使用相移干涉术来快速获得大面积转移石墨烯上原子级结构的形态信息。所获得的形态学信息包括褶皱,各种聚合物残留物以及转移的石墨烯的撕裂/开裂,并且其可以用于评估转移的石墨烯的质量,例如物理完整性,厚度和对目标基材的粘合强度。
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更新日期:2020-09-21
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