In this work the absolute differential cross sections of the ¹⁸O(d,pγ)¹⁹O (E_γ = 1376 keV) ,¹⁸O(d,nγ)¹⁹F (E_γ = 1357 keV) and ¹⁶O(d,pγ)¹⁷O (E_γ = 871 keV) reactions were measured for the isotopic analysis of oxygen by DIGE technique. The energy of the incident deuterons was varied from 590 to 1994 keV in steps of 10 keV. Gamma-rays and backscattered deuterons were collected simultaneously by an HPGe detector at an angle of 90^° and an ion implanted Si detector at a scattering angle of 165° with respect to the beam direction. An anodic Ta₂^16,18O₅ thin layer on tantalum was used throughout the cross sections measurement. The validity of obtained cross sections was checked by benchmarking experiment with a thick Y₂O₃ target. The overall systematic uncertainty of the measured cross section data was estimated to be better than 9%.

在这项工作中的绝对微分截面¹⁸ O（d，Pγ）¹⁹ ö（E _γ  = 1376千电子伏），¹⁸ O（d，NT个）¹⁹ F（Ë _γ  = 1357千电子伏）和¹⁶ O（d，Pγ ） 用DIGE技术测量了¹⁷ O（_Eγ = 871 keV）反应用于氧同位素分析。入射氘核的能量从590keV到1994keV不等，步长为10keV。相对于电子束方向，HPGe检测器以90 ^°的角度同时收集了γ射线和反向散射的氘核，离子注入的Si检测器以165°的散射角同时收集了它们。阳极Ta ₂ ^16,18 O在整个横截面测量中，使用了_5个钽薄层。通过使用厚的Y ₂ O ₃靶进行基准测试来检验所获得横截面的有效性。测得的横截面数据的整体系统不确定性估计优于9％。