Abstract SnS nanoflakes were synthesized by chemical route at a temperature of 80 °C. Stannous chloride and sodium sulphide was used as a source of Sn2+ and S2− ions respectively. The elemental stoichiometric analysis of SnS nanoflakes was done by employing energy dispersive analysis of X-rays (EDAX) technique. The structural study of the as-synthesized nanoflakes was studied by X-ray diffraction (XRD). The grain size was determined using X-ray diffraction (XRD) data employing Scherrer’s formula and Hall–Williamson plot. The residual strain produced in the synthesized nanoflakes during the synthesis was obtained from Hall–Williamson plot. The transmission electron microscopy (TEM) image showed that the synthesized nanoflakes have average crystallite size of 11 nm. The thermal decomposition of SnS nanoflakes was studied employing thermogravimetric (TG), differential thermogravimetric (DTG) and differential thermal analysis (DTA) techniques. The thermal behaviour of SnS nanoflakes was compared with SnS single crystals. The thermal parameters were evaluated of the SnS nanoflakes using two most common thermal analysis methods; Broido and Coats-Redfern (CR) relations. Thermal activation energy, enthalpy change (ΔH*), entropy change (ΔS*) and free energy change (ΔG*) related to the thermal decomposition process were calculated for the SnS nanoflakes. The obtained results are discussed in details.

中文翻译：

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SnS纳米薄片的合成和热研究

摘要 通过化学途径在 80 °C 下合成了 SnS 纳米薄片。氯化亚锡和硫化钠分别用作 Sn2+ 和 S2- 离子的来源。通过采用 X 射线能量色散分析 (EDAX) 技术对 SnS 纳米薄片进行元素化学计量分析。通过X射线衍射（XRD）研究合成的纳米薄片的结构研究。使用 X 射线衍射 (XRD) 数据，采用 Scherrer 公式和 Hall-Williamson 图确定晶粒尺寸。合成过程中合成纳米薄片中产生的残余应变是从霍尔-威廉姆森图获得的。透射电子显微镜 (TEM) 图像显示合成的纳米薄片的平均微晶尺寸为 11 nm。使用热重 (TG)、差示热重 (DTG) 和差热分析 (DTA) 技术研究了 SnS 纳米薄片的热分解。将 SnS 纳米薄片的热行为与 SnS 单晶进行了比较。使用两种最常见的热分析方法评估 SnS 纳米薄片的热参数；Broido 和 Coats-Redfern (CR) 关系。计算了与热分解过程相关的 SnS 纳米薄片的热活化能、焓变 (ΔH*)、熵变 (ΔS*) 和自由能变化 (ΔG*)。得到的结果进行了详细讨论。使用两种最常见的热分析方法评估 SnS 纳米薄片的热参数；Broido 和 Coats-Redfern (CR) 关系。计算了与热分解过程相关的 SnS 纳米薄片的热活化能、焓变 (ΔH*)、熵变 (ΔS*) 和自由能变化 (ΔG*)。得到的结果进行了详细讨论。使用两种最常见的热分析方法评估 SnS 纳米薄片的热参数；Broido 和 Coats-Redfern (CR) 关系。计算了与热分解过程相关的 SnS 纳米薄片的热活化能、焓变 (ΔH*)、熵变 (ΔS*) 和自由能变化 (ΔG*)。得到的结果进行了详细讨论。