Abstract

The problem of increasing the accuracy of an electron-diffraction experiment, on which the reliability of studying the nature of chemical bonding and the distributions of the electrostatic potential in nano-objects by this method depends, is solved. For this, a recording system was created on the basis of an EMR-102 electron diffractometer, which operates in the single-electron mode with high time (60 MHz) and spatial (tens of thousands of steps at 1 Å^–1) resolutions. Specialized software is developed that monitors the progress of the experiment and the processing of the obtained experimental data. With its help, the scanning system is controlled and the time and coordinate parameters of each event of operation of the electron detector are synchronously recorded. The developed diffractometer is used in a number of precision electron-diffraction studies, in which diffraction patterns are obtained with an accuracy of measuring the relative intensities and spatial (angular) resolution that is much better, compared to similar measurements described to date in publications.

中文翻译：

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电子衍射分析强度的精确测量

摘要

解决了提高电子衍射实验精度的问题，该问题依赖于用这种方法研究化学键的性质和纳米物体中静电势的分布的可靠性。为此，在EMR-102电子衍射仪的基础上创建了一个记录系统，该系统以单电子模式工作，具有高时间（60 MHz）和空间（1Å ^– 1的数万步））决议。开发了专用软件，该软件可以监视实验的进度以及所获得的实验数据的处理情况。借助其帮助，控制扫描系统，并同步记录电子探测器每次操作事件的时间和坐标参数。发达的衍射仪用于许多精确的电子衍射研究中，与迄今为止在出版物中描述的类似测量相比，获得的衍射图样具有更高的相对强度和空间（角度）分辨率测量精度。