Abstract—

The description of detectors based on measuring the secondary-emission current and results of their tests are presented. Multichannel profilometers with a range of n × 10³ to 10⁹ ions/(cm² s) have been created. This range is largely overlapped with the range from a few units to 10⁶ ions/(cm² s), which is characteristic of scintillation and semiconductor detectors. Current profilometers are used in the region of the overlap to monitor their degradation under exposure to the beam. The current profilometers are used in the transit of low-intensity beams, and their sensitivity is higher than the sensitivity of Al₂O₃ phosphors and Faraday cups by four orders of magnitude. A three-lamel probe has been created based on the secondary emission to measure the current of the internal accelerator beam with a lower-range value of 0.1 pA.

中文翻译：

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用于监测低强度重离子束闪烁和半导体探测器性能退化的多通道探测器

摘要-

介绍了基于测量二次发射电流的检测器的描述及其测试结果。已创建范围为n ×10 ³到10 ⁹离子/（cm ² s）的多通道轮廓仪。该范围与几个单位到10 ⁶离子/（cm ² s）的范围有很大的重叠，这是闪烁和半导体检测器的特征。在重叠的区域中使用电流轮廓仪以监视其在暴露于光束下的劣化。当前的轮廓仪用于低强度光束的传输，其灵敏度高于Al ₂ O ₃的灵敏度荧光粉和法拉第杯四个数量级。基于二次发射创建了一个三层探针，用于测量内部加速器光束的电流，其下限值为0.1 pA。