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A Multichannel Detector for Monitoring the Degradation of Scintillation and Semiconductor Detectors in Low-Intensity Heavy-Ion Beams
Instruments and Experimental Techniques ( IF 0.6 ) Pub Date : 2020-06-15 , DOI: 10.1134/s0020441220030057 Yu. G. Teterev , A. I. Krylov , A. T. Issatov , S. V. Mitrofanov
中文翻译:
用于监测低强度重离子束闪烁和半导体探测器性能退化的多通道探测器
更新日期:2020-06-15
Instruments and Experimental Techniques ( IF 0.6 ) Pub Date : 2020-06-15 , DOI: 10.1134/s0020441220030057 Yu. G. Teterev , A. I. Krylov , A. T. Issatov , S. V. Mitrofanov
Abstract—
The description of detectors based on measuring the secondary-emission current and results of their tests are presented. Multichannel profilometers with a range of n × 103 to 109 ions/(cm2 s) have been created. This range is largely overlapped with the range from a few units to 106 ions/(cm2 s), which is characteristic of scintillation and semiconductor detectors. Current profilometers are used in the region of the overlap to monitor their degradation under exposure to the beam. The current profilometers are used in the transit of low-intensity beams, and their sensitivity is higher than the sensitivity of Al2O3 phosphors and Faraday cups by four orders of magnitude. A three-lamel probe has been created based on the secondary emission to measure the current of the internal accelerator beam with a lower-range value of 0.1 pA.中文翻译:
用于监测低强度重离子束闪烁和半导体探测器性能退化的多通道探测器