Digital holographic microscopy is widely used for quantitative phase information detection. However, in this technique, phase information is usually concealed by aberrations such as tilt, quadratic aberration, and other high-order aberrations. There are few methods that truly capable of total phase aberration compensation. The method based on 1D standard polynomials fitting is one of them. Here, we will study its performance, including the ability of compensating large amount of high-order aberrations, the influence of sample locations and noise. The results are compared with that of the classical 2D Zernike polynomials fitting method. We also give some guidance on sample locations so that the samples are properly located to guarantee the good compensation. Additionally, we thoroughly analyze the similarity and difference between the two methods that both based on the 1D standard polynomials fitting. The results will facilitate the understanding and implement of this type of methods.

数字全息显微镜被广泛用于定量相位信息检测。然而，在该技术中，相位信息通常被诸如倾斜，二次像差和其他高阶像差之类的像差所掩盖。几乎没有真正能够进行总相差补偿的方法。基于一维标准多项式拟合的方法就是其中之一。在这里，我们将研究其性能，包括补偿大量高阶像差的能力，样品位置和噪声的影响。将结果与经典2D Zernike多项式拟合方法的结果进行比较。我们还对样本位置提供了一些指导，以便正确放置样本以保证良好的补偿。另外，我们基于一维标准多项式拟合，彻底分析了这两种方法之间的异同。结果将有助于理解和实施这种方法。