Advances in two-dimensional (2D) materials research have opened up new opportunities in miniaturization of optoelectronic and spintronic devices at the atomically thin limit. One major research thrust, which is the subject of this review, is the surface- and electronic structure of 2D materials and their van der Waals (vdW) heterostructures that may be significantly affected by the local atomic geometry and environment. As a result, there is a pressing need for powerful advanced microscopy and spectroscopy techniques for material characterization at a micro- or sub-micrometer lateral scale, which is a typical sample size in many 2D-materials experiments. Spectroscopic photoemission and low-energy electron microscopy (SPE-LEEM) offer a multifunctional approach that uniquely integrates microscopy, diffraction and spectroscopy techniques, enables real-time imaging and in situ structural, chemical and electronic analysis of surfaces and interfaces. This review covers the recent developments in SPE-LEEM investigations of surface- and electronic structure of 2D materials, and presents examples including exfoliated vdW layered materials, vdW heterostructures, and thin films synthesized by chemical vapor deposition and molecular beam epitaxy.

二维（2D）材料研究的进步为光电子和自旋电子器件的小型化提供了新的机会，使原子和原子极限变得更薄。本文的主题之一是2D材料的表面和电子结构以及它们的范德华（vdW）异质结构，这些结构可能会受到本地原子几何形状和环境的显着影响。结果，迫切需要功能强大的高级显微镜和光谱技术，以在微米或亚微米的横向尺度上表征材料，这是许多2D材料实验中的典型样本量。光谱光发射和低能电子显微镜（SPE-LEEM）提供了一种多功能的方法，该方法独特地集成了显微镜，衍射和光谱技术，表面和界面的原位结构，化学和电子分析。这篇综述涵盖了SPE-LEEM研究2D材料的表面和电子结构的最新进展，并提出了示例，包括剥离的vdW层状材料，vdW异质结构以及通过化学气相沉积和分子束外延合成的薄膜。